1287 search results - page 46 / 258 » Self-Normalized Linear Tests |
ICIP
2003
IEEE
14 years 9 months ago
2003
IEEE
A critical step in defect detection for semiconductorprocess is to align a test image against a reference. This includes both spatial alignment and grayscale alignment. For the la...
ICASSP
2011
IEEE
12 years 11 months ago
2011
IEEE
This paper investigates the performance of a new technique for speech enhancement which combines Linear Predictive (LP) spectrum-based perceptual filtering to the recordings obtai...
ICIP
2010
IEEE
14 years 1 months ago
2010
IEEE
We propose a registration method to find affine transformations
between 3D objects by constructing and solving an
overdetermined system of polynomial equations. We utilize
voxel...
EH
2005
IEEE
14 years 1 months ago
2005
IEEE
Co-evolution of system models and system tests can be used for exploratory system identification of physical platforms. Here we demonstrate how the amount of physical testing can ...
VLDB
2007
ACM
14 years 8 months ago
2007
ACM
Regression testing is an important software maintenance activity to ensure the integrity of a software after modification. However, most methods and tools developed for software te...