1287 search results - page 59 / 258 » Self-Normalized Linear Tests |
VLDB
2005
ACM
14 years 1 months ago
2005
ACM
In a recent paper [8], it was shown how tests for database application systems can be executed efficiently. The challenge was to control the state of the database during testing ...
MTDT
2000
IEEE
14 years 5 days ago
2000
IEEE
A new approach to diagnostic testing of embedded memories is presented which enables the design of tests that provide complete detection and distinguishing of all faults in a give...
TCAD
2010
13 years 2 months ago
2010
Abstract--An efficient passivity test based on canonical projector techniques is proposed for descriptor systems (DSs) widely encountered in circuit and system modeling. The test f...
VLSID
2007
IEEE
14 years 8 months ago
2007
IEEE
We introduce a novel method of test generation for microprocessors at the RTL using spectral methods. Test vectors are generated for RTL faults, which are the stuck-at faults on i...
ISCAS
2003
IEEE
14 years 1 months ago
2003
IEEE
A deterministic dynamic element matching (DEM) approach to ADC testing is introduced and compared with a common random DEM method. With both approaches, a highly non-ideal DAC is ...