1287 search results - page 9 / 258 » Self-Normalized Linear Tests |
APPML
2004
13 years 7 months ago
2004
In this paper, a new condition for the controllability of higher order linear dynamical systems is obtained. The suggested test contains rank conditions of suitably defined matric...
BMCBI
2006
13 years 7 months ago
2006
Background: In gene networks, the timing of significant changes in the expression level of each gene may be the most critical information in time course expression profiles. With ...
DAM
2007
13 years 7 months ago
2007
Primitive words, or strings over a finite alphabet that cannot be written as a power of another string, play an important role in numerous research areas including formal language...
DATE
1997
IEEE
13 years 12 months ago
1997
IEEE
Many Built-In Self Test pattern generators use Linear Feedback Shift Registers (LFSR) to generate test sequences. In this paper, we address the generation of deterministic pairs o...
TC
2008
13 years 7 months ago
2008
A low-transition test pattern generator, called the low-transition linear feedback shift register (LT-LFSR), is proposed to reduce the average and peak power of a circuit during te...