Data reliability has been drawn much concern in large-scale data warehouses with 1PB or more data. It highly depends on many inter-dependent system parameters, such as the replica ...
Kai Du, Zhengbing Hu, Huaimin Wang, Yingwen Chen, ...
We present a general machine learning framework for modelling the phenomenon of missing information in data. We propose a masking process model to capture the stochastic nature of...
Abstract: Test methodologies for large embedded systems fail to reflect the test process as a whole. Instead, the test process is divided into independent test levels feaifferences...
Building an interactive application requires, amongst other activities, the design of both a data model and a user interface. These two designs are often done separately, frequent...
Dennis J. M. J. de Baar, James D. Foley, Kevin E. ...
Data Driven Time Synchronization (DDTS) provides synchronization across sensors by using underlying characteristics of data collected by an embedded sensing system. We apply the c...
Martin Lukac, Paul Davis, Robert Clayton, Deborah ...