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JCP
2008
101views more  JCP 2008»
13 years 7 months ago
Reliability Design for Large Scale Data Warehouses
Data reliability has been drawn much concern in large-scale data warehouses with 1PB or more data. It highly depends on many inter-dependent system parameters, such as the replica ...
Kai Du, Zhengbing Hu, Huaimin Wang, Yingwen Chen, ...
IJCAI
2007
13 years 9 months ago
Learning from Partial Observations
We present a general machine learning framework for modelling the phenomenon of missing information in data. We propose a masking process model to capture the stochastic nature of...
Loizos Michael
SE
2010
13 years 9 months ago
Multi-Level Test Models for Embedded Systems
Abstract: Test methodologies for large embedded systems fail to reflect the test process as a whole. Instead, the test process is divided into independent test levels feaifferences...
Abel Marrero Pérez, Stefan Kaiser
CHI
1992
ACM
13 years 12 months ago
Coupling Application Design and User Interface Design
Building an interactive application requires, amongst other activities, the design of both a data model and a user interface. These two designs are often done separately, frequent...
Dennis J. M. J. de Baar, James D. Foley, Kevin E. ...
IPSN
2009
Springer
14 years 2 months ago
Recovering temporal integrity with Data Driven Time Synchronization
Data Driven Time Synchronization (DDTS) provides synchronization across sensors by using underlying characteristics of data collected by an embedded sensing system. We apply the c...
Martin Lukac, Paul Davis, Robert Clayton, Deborah ...