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ICPR
2000
IEEE
16 years 5 months ago
Nanometer-Scale Height Measurements in Micromachined Picoliter Vials Based on Interference Fringe Analysis
Micromachined picoliter vials in silicon dioxide with a typical depth of 6.0?m are filled with a liquid sample. Epiilluminated microscopic imaging during evaporation of the liquid...
L. R. Van den Doel, Lucas J. van Vliet, K. T. Hjel...
MICCAI
2004
Springer
16 years 5 months ago
Integrated Intensity and Point-Feature Nonrigid Registration
Abstract. In this work, we present a method for the integration of feature and intensity information for non rigid registration. Our method is based on a free-form deformation mode...
Xenophon Papademetris, Andrea P. Jackowski, Robert...
SINOBIOMETRICS
2004
Springer
15 years 10 months ago
Face Recognition Under Varying Lighting Based on Derivates of Log Image
This paper considers the problem of recognizing faces under varying illuminations. First, we investigate the statistics of the derivative of the irradiance images (log) of human f...
Laiyun Qing, Shiguang Shan, Wen Gao
ICIP
2007
IEEE
15 years 11 months ago
Automatic Measures for Predicting Performance in Off-Line Signature
Performance in terms of accuracy is one of the most important goal of a biometric system. Hence, having a measure which is able to predict the performance with respect to a partic...
Fernando Alonso-Fernandez, Michael C. Fairhurst, J...
MICCAI
2008
Springer
16 years 5 months ago
A Slicing-Based Coherence Measure for Clusters of DTI Integral Curves
We present a slicing-based coherence measure for clusters of DTI integral curves. For a given cluster, we probe samples from the cluster by slicing it with a plane at regularly spa...
Çagatay Demiralp, Gregory Shakhnarovich, So...