9 search results - page 2 / 2 » Simultaneous test pattern compaction, ordering and X-filling... |
ATS
2004
IEEE
13 years 11 months ago
2004
IEEE
In this paper, we propose a low-power testing methodology for the scan-based BIST. A smoother is included in the test pattern generator (TPG) to reduce average power consumption d...
BMCBI
2010
13 years 4 months ago
2010
Background: The analysis of Inter-Alu PCR patterns obtained from human genomic DNA samples is a promising technique for a simultaneous analysis of many genomic loci flanked by Alu...
FGR
2006
IEEE
14 years 1 months ago
2006
IEEE
Robust gesture recognition in video requires segmentation of the meaningful gestures from a whole body gesture sequence. This is a challenging problem because it is not straightfo...
BMCBI
2010
13 years 7 months ago
2010
Background: Microarray technology allows the simultaneous analysis of thousands of genes within a single experiment. Significance analyses of transcriptomic data ignore the gene d...