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ICCAD
2006
IEEE
107views Hardware» more  ICCAD 2006»
14 years 8 months ago
Current path analysis for electrostatic discharge protection
The electrostatic discharge (ESD) problem has become a challenging reliability issue in nanometer circuit design. High voltages resulted from ESD might cause high current densitie...
Hung-Yi Liu, Chung-Wei Lin, Szu-Jui Chou, Wei-Ting...
SEMCO
2009
IEEE
14 years 5 months ago
Using a Formal Language Constructs for Software Model Evolution
— In this paper we present an automated support for software model evolution using a formal language constructs. For this, we extended Object Constraint Language (OCL) with actio...
Samuel A. Ajila, Shahid Alam
WEBI
2009
Springer
14 years 5 months ago
Rigorous Probabilistic Trust-Inference with Applications to Clustering
The World Wide Web has transformed into an environment where users both produce and consume information. In order to judge the validity of information, it is important to know how...
Thomas DuBois, Jennifer Golbeck, Aravind Srinivasa...
IWPEC
2009
Springer
14 years 5 months ago
On the Directed Degree-Preserving Spanning Tree Problem
In this paper we initiate a systematic study of the Reduced Degree Spanning Tree problem, where given a digraph D and a nonnegative integer k, the goal is to construct a spanning o...
Daniel Lokshtanov, Venkatesh Raman, Saket Saurabh,...
ICC
2008
IEEE
127views Communications» more  ICC 2008»
14 years 5 months ago
On the Devolution of Large-Scale Sensor Networks in the Presence of Random Failures
—In battery-constrained large-scale sensor networks, nodes are prone to random failures due to various reasons, such as energy depletion and hostile environment. Random failures ...
Fei Xing, Wenye Wang