30 search results - page 3 / 6 » Soft Error Modeling and Protection for Sequential Elements |
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
As devices are scaled to the nanoscale regime, it is clear that future nanodevices will be plagued by higher soft error rates and reduced noise margins. Traditional implementation...
DSN
2002
IEEE
14 years 14 days ago
2002
IEEE
This paper examines the effect of technology scaling and microarchitectural trends on the rate of soft errors in CMOS memory and logic circuits. We describe and validate an end-to...
SIGMETRICS
2011
ACM
12 years 10 months ago
2011
ACM
The amount of charge stored in an SRAM cell shrinks rapidly with each technology generation thus increasingly exposing caches to soft errors. Benchmarking the FIT rate of caches d...
VLSID
2006
IEEE
14 years 7 months ago
2006
IEEE
Radiation induced soft errors in combinational logic is expected to become as important as directly induced errors on state elements. Consequently, it has become important to deve...
DAC
2005
ACM
13 years 9 months ago
2005
ACM
Reliability of nanometer circuits is becoming a major concern in today’s VLSI chip design due to interferences from multiple noise sources as well as radiation-induced soft erro...