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ICSE
2009
IEEE-ACM
15 years 11 months ago
The Automated Generation of Test Cases Using an Extended Domain Based Reliability Model
Alberto Avritzer, Elaine J. Weyuker
ISSTA
2000
ACM
15 years 11 months ago
Automated Testing of Classes
Ugo A. Buy, Alessandro Orso, Mauro Pezzè