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SIGMOD
2006
ACM
89views Database» more  SIGMOD 2006»
14 years 8 months ago
Testing database applications
Testing of database applications is crucial for ensuring high software quality as undetected faults can result in unrecoverable data corruption. The problem of database applicatio...
Carsten Binnig, Donald Kossmann, Eric Lo
MOBISYS
2007
ACM
14 years 8 months ago
SmartSiren: virus detection and alert for smartphones
Smartphones have recently become increasingly popular because they provide "all-in-one" convenience by integrating traditional mobile phones with handheld computing devi...
Jerry Cheng, Starsky H. Y. Wong, Hao Yang, Songwu ...
ICCD
2008
IEEE
202views Hardware» more  ICCD 2008»
14 years 5 months ago
CrashTest: A fast high-fidelity FPGA-based resiliency analysis framework
— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures...
Andrea Pellegrini, Kypros Constantinides, Dan Zhan...

Lab
1058views
14 years 5 months ago
UP Electrical and Electronics Engineering Institute
The Institute's mission is to produce excellent, innovative and nationalistic engineers and to advance the field of electrical and electronics engineering. The undergr...
ICCAD
2003
IEEE
109views Hardware» more  ICCAD 2003»
14 years 5 months ago
Large-Scale Circuit Placement: Gap and Promise
Placement is one of the most important steps in the RTLto-GDSII synthesis process, as it directly defines the interconnects, which have become the bottleneck in circuit and syste...
Jason Cong, Tim Kong, Joseph R. Shinnerl, Min Xie,...
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