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ICCAD
2006
IEEE
14 years 5 months ago
2006
IEEE
- Redundant via insertion and line end extension employed in the post-routing stage are two well known and highly recommended techniques to reduce yield loss due to via failure. Ho...
TCAD
2008
13 years 8 months ago
2008
Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the mos...
SIAMREV
2010
13 years 3 months ago
2010
The affine rank minimization problem consists of finding a matrix of minimum rank that satisfies a given system of linear equality constraints. Such problems have appeared in the ...
SOCIALCOM
2010
13 years 6 months ago
2010
The huge size of online social networks (OSNs) makes it prohibitively expensive to precisely measure any properties which require the knowledge of the entire graph. To estimate the...
GLVLSI
2003
IEEE
14 years 2 months ago
2003
IEEE
One of the fundamental problems in Deep Sub Micron (DSM) circuits is Simultaneous Switching Noise (SSN), which causes voltage fluctuations in the circuit power/ground networks. In...