283 search results - page 57 / 57 » Solving Over-Constrained Problems with SAT |
CONSTRAINTS
2007
13 years 7 months ago
2007
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
COCO
2005
Springer
14 years 17 days ago
2005
Springer
We study the complexity of solving succinct zero-sum games, i.e., the games whose payoff matrix M is given implicitly by a Boolean circuit C such that M(i, j) = C(i, j). We comple...
IJFCS
2006
13 years 7 months ago
2006
For successful software verification, model checkers must be capable of handling a large number of program variables. Traditional, BDD-based model checking is deficient in this re...