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GI
2009
Springer
14 years 1 months ago
Challenges of Electronic CAD in the Nano Scale Era
: Future nano scale devices will expose different characteristics than todays silicon devices. While the exponential growth of non recurring expenses (NRE, mostly due to mask sets)...
Christian Hochberger, Andreas Koch
C5
2003
IEEE
14 years 1 months ago
SuperSwiki - Bringing collaboration to the class room
SuperSwiki is a not yet well defined term. Its origins go back to Ward Cunningham's Wiki and its Squeak variant, the Swiki. It provides a place to share and edit web pages, f...
Michael Rüger
ICDE
2008
IEEE
563views Database» more  ICDE 2008»
15 years 8 months ago
Probabilistic Verifiers: Evaluating Constrained Nearest-Neighbor Queries over Uncertain Data
In applications like location-based services, sensor monitoring and biological databases, the values of the database items are inherently uncertain in nature. An important query fo...
Reynold Cheng, Jinchuan Chen, Mohamed F. Mokbel, C...
CVPR
2004
IEEE
14 years 10 months ago
2D-Shape Analysis Using Conformal Mapping
The study of 2D shapes and their similarities is a central problem in the field of vision. It arises in particular from the task of classifying and recognizing objects from their ...
Eitan Sharon, David Mumford
ICCV
2005
IEEE
14 years 10 months ago
Efficient Learning of Relational Object Class Models
We present an efficient method for learning part-based object class models from unsegmented images represented as sets of salient features. A model includes parts' appearance...
Aharon Bar-Hillel, Tomer Hertz, Daphna Weinshall