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75
Voted
SCAM
2009
IEEE
15 years 10 months ago
An Assessment of Type-3 Clones as Detected by State-of-the-Art Tools
Rebecca Tiarks, Rainer Koschke, Raimar Falke
94
Voted
SCAM
2009
IEEE
15 years 10 months ago
Evolution of Type-1 Clones
Nils Göde
SCAM
2009
IEEE
15 years 10 months ago
Static Estimation of Test Coverage
Tiago L. Alves, Joost Visser
87
Voted
SCAM
2009
IEEE
15 years 10 months ago
Lightweight Techniques for Tracking Unique Program Statements
Jaime Spacco, Chadd C. Williams