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VTS
1999
IEEE
66views Hardware» more  VTS 1999»
14 years 2 months ago
A New Bare Die Test Methodology
1 While multichip module technology has been developed for high performance IC applications, the technology is not widely adopted due to economical reasons. One of the reasons that...
Zao Yang, K.-T. Cheng, K. L. Tai
SIGIR
1998
ACM
14 years 2 months ago
Improving Automatic Query Expansion
Most casual users of IR systems type short queries. Recent research has shown that adding new words to these queries via adhoc feedback improves the retrieval e ectiveness of such ...
Mandar Mitra, Amit Singhal, Chris Buckley
ISSTA
1993
ACM
14 years 2 months ago
Faults on Its Sleeve: Amplifying Software Reliability Testing
Most of the effort that goes into improving the quality of software paradoxically does not lead to quantitative, measurable quality. Software developers and quality-assurance orga...
Richard G. Hamlet, Jeffrey M. Voas
CRYPTO
1992
Springer
181views Cryptology» more  CRYPTO 1992»
14 years 2 months ago
Fair Public-Key Cryptosystems
Abstract Joseph Kilian NEC Research Princeton, NJ 08540 Tom Leighton Mathematics Department Laboratory for Computer Science MIT Cambridge, MA 02139 August 17, 1994 Fair" Publ...
Silvio Micali
CSFW
2010
IEEE
14 years 1 months ago
Information Flow in Credential Systems
—This paper proposes a systematic study of information flow in credential-based declarative authorization policies. It argues that a treatment in terms of information flow is n...
Moritz Y. Becker