With continuous scaling of transistors in each technology generation, NBTI and Process Variation (PV) have become very important silicon reliability problems for the microprocesso...
Taniya Siddiqua, Sudhanva Gurumurthi, Mircea R. St...
— Negative Bias Temperature Instability (NBTI) in PMOS transistors has become a significant reliability concern in present day digital circuit design. With continued scaling, th...
Sanjay V. Kumar, Chris H. Kim, Sachin S. Sapatneka...
In this paper, we propose a formal analysis approach to estimate the expected (average) data cache access time of an application across all possible program inputs. Towards this g...
In this paper, we propose a framework for modelling agent organizations, OMNI, that allows the balance of global organizational requirements with the autonomy of individual agents...
Agility, speed and flexibility in production networks are required in today's global competition in the flat world. The accuracy of order date delivery promises is a key elem...
Juhani Heilala, Jari Montonen, Arttu Salmela, Pasi...