1459 search results - page 278 / 292 » Statistical Modeling for Circuit Simulation |
BMCBI
2006
13 years 8 months ago
2006
Background: The small sample sizes often used for microarray experiments result in poor estimates of variance if each gene is considered independently. Yet accurately estimating v...
ICCD
2008
IEEE
14 years 5 months ago
2008
IEEE
— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures...
ICCD
2006
IEEE
14 years 5 months ago
2006
IEEE
— New back-end design for manufacturability rules have brought guarantee rules for interconnect matching. These rules indicate a certain capacitance matching guarantee given spac...
DATE
2009
IEEE
14 years 3 months ago
2009
IEEE
In modern digital ICs, the increasing demand for performance and throughput requires operating frequencies of hundreds of megahertz, and in several cases exceeding the gigahertz r...
DATE
2008
IEEE
14 years 3 months ago
2008
IEEE
— As the feature size of transistors gets smaller, fabricating them becomes challenging. Manufacturing process follows various corrective design-for-manufacturing (DFM) steps to ...