396 search results - page 6 / 80 » Statistical Pattern Recognition: A Review |
ICPR
2000
IEEE
14 years 5 days ago
2000
IEEE
Applied statistics are widely used in pattern recognition and other computing applications tofind the most likely value of a parameter. The use of classical empirical statistics i...
BIB
2008
13 years 8 months ago
2008
Biology, chemistry and medicine are faced by tremendous challenges caused by an overwhelming amount of data and the need for rapid interpretation. Computational intelligence (CI) ...
AIPR
2003
IEEE
14 years 7 days ago
2003
IEEE
The techniques for defect detection on plain (unpatterned) fabrics have been well developed nowadays. This paper is on developing visual inspection methods for defect detection on...
CIARP
2010
Springer
13 years 6 months ago
2010
Springer
The aim of this paper is to present a dissimilarity measure strategy by which a new philosophy for pattern classification pertaining to dissimilaritybased classifications (DBCs) ca...
MVA
1990
13 years 9 months ago
1990
In this paper, we describe a commercial vision system for the digitisation and extraction of horizons drawn with coloured pencils on seismic sections. The system combines image pr...