685 search results - page 74 / 137 » Statistical analysis of sketch estimators |
ICANN
2001
Springer
14 years 4 days ago
2001
Springer
Humans tend to group together related properties in order to understand complex phenomena. When modeling large problems with limited representational resources, it is important to...
CORR
2010
Springer
13 years 7 months ago
2010
Springer
High-dimensional statistical inference deals with models in which the the number of parameters p is comparable to or larger than the sample size n. Since it is usually impossible ...
ICIP
2004
IEEE
14 years 9 months ago
2004
IEEE
We consider the problem of extracting clean images from noisy mixtures of images degraded by blur operators. This special case of source separation arises, for instance, when anal...
ICIP
2003
IEEE
14 years 9 months ago
2003
IEEE
Due to attenuation and spatial smoothing that occurs in the conducting media, the bioelectric inverse problem of estimating sources from remote measurements is ill-posed and solut...
DFT
2007
IEEE
14 years 2 months ago
2007
IEEE
Growth of pixel density and sensor array size increases the likelihood of developing in-field pixel defects. An ongoing study on defect development in imagers has now provided us ...