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» Statistical significance of MUC-6 results
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VLSID
2007
IEEE
209views VLSI» more  VLSID 2007»
14 years 9 months ago
Simultaneous Power Fluctuation and Average Power Minimization during Nano-CMOS Behavioral Synthesis
We present minimization methodologies and an algorithm for simultaneous scheduling, binding, and allocation for the reduction of total power and power fluctuation during behaviora...
Saraju P. Mohanty, Elias Kougianos
VLSID
2007
IEEE
131views VLSI» more  VLSID 2007»
14 years 9 months ago
Probabilistic Self-Adaptation of Nanoscale CMOS Circuits: Yield Maximization under Increased Intra-Die Variations
As technology scales to 40nm and beyond, intra-die process variability will cause large delay and leakage variations across a chip in addition to expected die-to-die variations. I...
Maryam Ashouei, Muhammad Mudassar Nisar, Abhijit C...
RECOMB
2005
Springer
14 years 9 months ago
A Hidden Markov Model Based Scoring Function for Mass Spectrometry Database Search
An accurate scoring function for database search is crucial for peptide identification using tandem mass spectrometry. Although many mathematical models have been proposed to scor...
Yunhu Wan, Ting Chen
EUROSYS
2006
ACM
14 years 6 months ago
Automated known problem diagnosis with event traces
Computer problem diagnosis remains a serious challenge to users and support professionals. Traditional troubleshooting methods relying heavily on human intervention make the proce...
Chun Yuan, Ni Lao, Ji-Rong Wen, Jiwei Li, Zheng Zh...
ICCAD
2006
IEEE
95views Hardware» more  ICCAD 2006»
14 years 6 months ago
Robust estimation of parametric yield under limited descriptions of uncertainty
Reliable prediction of parametric yield for a specific design is difficult; a significant reason is the reliance of the yield estimation methods on the hard-to-measure distributio...
Wei-Shen Wang, Michael Orshansky