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VLSI
2005
Springer
14 years 4 months ago
Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint
1 The increasing test data volume required to ensure high test quality when testing a System-on-Chip is becoming a problem since it (the test data volume) must fit the ATE (Automa...
Erik Larsson, Stina Edbom
JWSR
2007
99views more  JWSR 2007»
13 years 11 months ago
A Metamorphic Testing Approach for Online Testing of Service-Oriented Software Applications
: Testing the correctness of services assures the functional quality of service-oriented application. A service-oriented application may bind dynamically to its supportive services...
W. Chan, S. Cheung, K. Leung
ICSM
2009
IEEE
14 years 5 months ago
Introducing a test suite similarity metric for event sequence-based test cases
Most of today’s event driven software (EDS) systems are tested using test cases that are carefully constructed as sequences of events; they test the execution of an event in the...
Penelope A. Brooks, Atif M. Memon
AMOST
2007
ACM
14 years 3 months ago
Combining test case generation for component and integration testing
When integrating dierent system components, the interaction between dierent features is often error prone. Typically errors occur on interruption, concurrency or disabling/ enabli...
Sebastian Benz
ESEM
2007
ACM
14 years 3 months ago
Defect Detection Efficiency: Test Case Based vs. Exploratory Testing
This paper presents a controlled experiment comparing the defect detection efficiency of exploratory testing (ET) and test case based testing (TCT). While traditional testing lite...
Juha Itkonen, Mika Mäntylä, Casper Lasse...