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COMPSAC
2006
IEEE
14 years 4 months ago
Backtracking Algorithms and Search Heuristics to Generate Test Suites for Combinatorial Testing
Combinatorial covering arrays have been used in several testing approaches. This paper first discusses some existing methods for finding such arrays. Then a SAT-based approach a...
Jun Yan, Jian Zhang
CIKM
2005
Springer
14 years 3 months ago
Maximal termsets as a query structuring mechanism
Search engines process queries conjunctively to restrict the size of the answer set. Further, it is not rare to observe a mismatch between the vocabulary used in the text of Web p...
Bruno Pôssas, Nivio Ziviani, Berthier A. Rib...
IOLTS
2000
IEEE
105views Hardware» more  IOLTS 2000»
14 years 2 months ago
Comparison between Random and Pseudo-Random Generation for BIST of Delay, Stuck-at and Bridging Faults
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...
Patrick Girard, Christian Landrault, Serge Pravoss...
FMCO
2006
Springer
128views Formal Methods» more  FMCO 2006»
14 years 1 months ago
Model-Based Test Selection for Infinite-State Reactive Systems
This paper addresses the problem of off-line selection of test cases for testing the conformance of a black-box implementation with respect to a specification, in the context of re...
Bertrand Jeannet, Thierry Jéron, Vlad Rusu
ISSRE
2003
IEEE
14 years 3 months ago
Test-Driven Development as a Defect-Reduction Practice
Test-driven development is a software development practice that has been used sporadically for decades. With this practice, test cases (preferably automated) are incrementally wri...
Laurie A. Williams, E. Michael Maximilien, Mladen ...