576 search results - page 84 / 116 » Structured metric learning for high dimensional problems |
29
Voted
CSB
2004
IEEE
13 years 11 months ago
2004
IEEE
Feature selection and weighting are central problems in pattern recognition and instance-based learning. In this work, we discuss the challenges of constructing and weighting feat...
CVPR
2007
IEEE
14 years 9 months ago
2007
IEEE
Image patches are fundamental elements for object modeling and recognition. However, there has not been a panoramic study of the structures of the whole ensemble of natural image ...
ICDM
2002
IEEE
14 years 18 days ago
2002
IEEE
This paper describes a novel data mining approach that employs evolutionary programming to discover knowledge represented in Bayesian networks. There are two different approaches ...
ICCV
2011
IEEE
12 years 7 months ago
2011
IEEE
Rank correlation measures are known for their resilience to perturbations in numeric values and are widely used in many evaluation metrics. Such ordinal measures have rarely been ...
ICPR
2004
IEEE
14 years 8 months ago
2004
IEEE
In this paper, we propose an unsupervised approach to select representative face samples (models) from raw videos and build an appearance-based face recognition system. The approa...