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» Syntactic Abstraction of B Models to Generate Tests
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CADE
2009
Springer
14 years 2 months ago
Interpolant Generation for UTVPI
Abstract. The problem of computing Craig interpolants in SMT has recently received a lot of interest, mainly for its applications in formal verification. Efficient algorithms for ...
Alessandro Cimatti, Alberto Griggio, Roberto Sebas...
TAICPART
2010
IEEE
158views Education» more  TAICPART 2010»
13 years 6 months ago
Bad Pairs in Software Testing
Abstract. With pairwise testing, the test model is a list of N parameters. Each test case is an N-tuple; the test space is the cross product of the N parameters. A pairwise test is...
Daniel Hoffman, Chien Chang, Gary Bazdell, Brett S...
ACL
1993
13 years 9 months ago
Towards History-Based Grammars: Using Richer Models for Probabilistic Parsing
We describe a generative probabilistic model of natural language, which we call HBG, that takes advantage of detailed linguistic information to resolve ambiguity. HBG incorporates...
Ezra Black, Frederick Jelinek, John D. Lafferty, D...
JSW
2007
107views more  JSW 2007»
13 years 7 months ago
Reducing Domain Level Scenarios to Test Component-based Software
—Higher-order black box software tests against independent end user domain requirements has become an issue of increasing importance with compositional reuse of software artifact...
Oliver Skroch, Klaus Turowski
ASYNC
2000
IEEE
122views Hardware» more  ASYNC 2000»
14 years 6 days ago
DUDES: A Fault Abstraction and Collapsing Framework for Asynchronous Circuits
Fault Abstraction and Collapsing Framework for Asynchronous Circuits Philip P. Shirvani, Subhasish Mitra Center for Reliable Computing Stanford University Stanford, CA Jo C. Eberge...
Philip P. Shirvani, Subhasish Mitra, Jo C. Ebergen...