171 search results - page 24 / 35 » Synthesis of Efficient Linear Test Pattern Generators |
IS
2008
13 years 9 months ago
2008
Implementations that load XML documents and give access to them via, e.g., the DOM, suffer from huge memory demands: the space needed to load an XML document is usually many times...
TCAD
2002
13 years 8 months ago
2002
A test pattern generator (TPG) for built-in self-test (BIST), which can reduce switching activity during test application, is proposed. The proposed TPG, called dual-speed LFSR (DS...
GECCO
2006
Springer
14 years 22 days ago
2006
Springer
In this paper an evolutionary algorithm is used for evolving gaits in a walking biped robot controller. The focus is fast learning in a real-time environment. An incremental appro...
DSD
2005
IEEE
13 years 11 months ago
2005
IEEE
Several methods improving the fault coverage in mixed-mode BIST are presented in this paper. The test is divided into two phases: the pseudo-random and deterministic. Maximum of f...
PR
2006
13 years 9 months ago
2006
A novel training method has been proposed for increasing efficiency and generalization of support vector machine (SVM). The efficiency of SVM in classification is directly determi...