— We propose a new family of classification algorithms in the spirit of support vector machines, that builds in non-conservative protection to noise and controls overfitting. O...
Discrete-event simulation is a common tool for the analysis of semiconductor manufacturing systems. With the aid of a simulation model, and in conjunction with sensitivity analysi...
Scott L. Rosen, Chad A. Geist, Daniel A. Finke, Jy...
We consider a distributed source coding system in which several observations must be encoded separately and communicated to the decoder by using limited transmission rate. We intro...
Manufacturing processes are a key source of faults in complex hardware systems. Minimizing this impact of manufacturing uncertainties is one way towards achieving fault tolerant s...
— The analysis of the EKF error sequence in [1] is expanded to the case with non-vanishing perturbations. The robust stability of NMPC and EKF pair is established. In addition, w...
Rui Huang, Sachin C. Patwardhan, Lorenz T. Biegler