Abstract: Test methodologies for large embedded systems fail to reflect the test process as a whole. Instead, the test process is divided into independent test levels feaifferences...
This paper discusses systematic approaches to the design of distributed controllers in industrial automation systems. Several design approaches are compared that lead to the distr...
Valeriy Vyatkin, Martin Hirsch 0002, Hans-Michael ...
With traditional testing, the test case has no control over non-deterministic scheduling decisions, and thus errors dependent on scheduling are only found by pure chance. Java Pat...
In software for embedded systems, the frequent use of interrupts for timing, sensing, and I/O processing can cause concurrency faults to occur due to interactions between applicat...
Components (in-house or pre-fabricated) are increasingly being used to reduce the cost of software development. Given that these components may not have not been developed with de...