Sciweavers

1812 search results - page 19 / 363
» Test Early, Test Often
Sort
View
COMPSAC
2003
IEEE
14 years 1 months ago
BINTEST - Binary Search-based Test Case Generation
One of the important tasks during software testing is the generation of test cases. Various approaches have been proposed to automate this task. The approaches available, however,...
Sami Beydeda, Volker Gruhn
ICST
2011
IEEE
13 years 4 days ago
Exploiting Common Object Usage in Test Case Generation
—Generated test cases are good at systematically exploring paths and conditions in software. However, generated test cases often do not make sense. We adapt test case generation ...
Gordon Fraser, Andreas Zeller
ATS
2009
IEEE
99views Hardware» more  ATS 2009»
14 years 3 months ago
Test Generation for Designs with On-Chip Clock Generators
High performance designs often use the on-chip device PLLs for accurate test clock generation during testing. The on-chip clock generator is designed in a programmable way to faci...
Xijiang Lin, Mark Kassab
ERSHOV
2006
Springer
14 years 3 days ago
TTCN-3 for Distributed Testing Embedded Software
Abstract. TTCN-3 is a standardized language for specifying and executing test suites that is particularly popular for testing embedded systems. Prior to testing embedded software i...
Stefan Blom, Thomas Deiß, Natalia Ioustinova...
TAP
2008
Springer
102views Hardware» more  TAP 2008»
13 years 8 months ago
A Logic-Based Approach to Combinatorial Testing with Constraints
Abstract. Usage of combinatorial testing is wide spreading as an effective technique to reveal unintended feature interaction inside a given system. To this aim, test cases are con...
Andrea Calvagna, Angelo Gargantini