1812 search results - page 33 / 363 » Test Early, Test Often |
ICFEM
2000
Springer
14 years 1 days ago
2000
Springer
Use Cases are a wide-spread informal method for specifying the requirements of a technical system in the early development phase. Z is a formal notation which aims to support, bes...
ICSE
2007
IEEE-ACM
14 years 8 months ago
2007
IEEE-ACM
Software engineers frequently update COTS components integrated in component-based systems, and can often chose among many candidates produced by different vendors. This paper tac...
ATS
2009
IEEE
14 years 3 months ago
2009
IEEE
Embedded memory quality is critical to overall chip quality. New defect mechanisms that occur at advanced process nodes (65nm and below) are often more pronounced in memories due ...
IJCAI
2003
13 years 9 months ago
2003
Often the most expensive and time-consuming task in building a pattern recognition system is col lecting and accurately labeling training and testing data. In this paper, we exp...
ICST
2010
IEEE
13 years 7 months ago
2010
IEEE
—A random testing strategy can be effective at finding faults, but may leave some routines entirely untested if it never gets to call them on objects satisfying their preconditi...