1812 search results - page 51 / 363 » Test Early, Test Often |
VTS
2002
IEEE
14 years 1 months ago
2002
IEEE
For deep sub-micron system-on-chips (SoC), interconnects are critical determinants of performance, reliability and power. Buses and long interconnects being susceptible to crossta...
TCAD
2002
13 years 8 months ago
2002
As IC densities are increasing, cluster-based FPGA architectures are becoming the architecture of choice for major FPGA manufacturers. A cluster-based architecture is one in which...
ICTAC
2010
Springer
13 years 7 months ago
2010
Springer
Flash memory has become a virtually indispensable component for mobile devices in today’s information society. However, conventional testing methods often fail to detect hidden b...
SIGSOFT
2010
ACM
13 years 6 months ago
2010
ACM
This article proposes a research agenda aimed at enabling optimized testing and analysis processes and tools to support component-based software development communities. We hypoth...
COMPSAC
2007
IEEE
14 years 2 months ago
2007
IEEE
Although many of the software engineering activities can now be model-supported, the model is often missing in software development. We are interested in retrieving statemachine m...