1016 search results - page 31 / 204 » Test Generation for Designs with On-Chip Clock Generators |
IICAI
2007
13 years 9 months ago
2007
The paper presents first results of a project that aims at building a model-based tool for functional testing of control software for passenger vehicles. The objective is that this...
ICST
2010
IEEE
13 years 6 months ago
2010
IEEE
Abstract—Software Product Lines (SPL) are difficult to validate due to combinatorics induced by variability across their features. This leads to combinatorial explosion of the n...
FUIN
2007
13 years 7 months ago
2007
Testing of database applications is of great importance. Although various studies have been conducted to investigate testing techniques for database design, relatively few efforts ...
GLVLSI
2002
IEEE
14 years 18 days ago
2002
IEEE
This paper develops new techniques for detecting both stuck-open faults and resistive open faults, which result in increased delays along some paths. The improved detection of CMO...
ICCD
2004
IEEE
14 years 4 months ago
2004
IEEE
— We propose an automatic test pattern generation (ATPG) framework for combinational threshold networks. The motivation behind this work lies in the fact that many emerging nanot...