1016 search results - page 46 / 204 » Test Generation for Designs with On-Chip Clock Generators |
DDECS
2008
IEEE
14 years 2 months ago
2008
IEEE
— Due to ever increasing design sizes more efficient tools for Automatic Test Pattern Generation (ATPG) are needed. Recently ATPG based on Boolean satisfiability (SAT) has been ...
ITC
1997
IEEE
13 years 12 months ago
1997
IEEE
Abstract- This paper describes a new method to generate analog signals with high precision at very low hardware complexity. This method consists in reproducing periodically a recor...
MTDT
2003
IEEE
14 years 29 days ago
2003
IEEE
Memory cores (especially SRAM cores) used on a system chip usually come from a memory compiler. Commercial memory compilers have their limitation— a large memory may need to be ...
JAL
1998
13 years 7 months ago
1998
We describe a very general technique for generating families of combinatorial objects without isomorphs. It applies to almost any class of objects for which an inductive construct...
HICSS
2009
IEEE
14 years 2 months ago
2009
IEEE
This paper discusses the design and implementation of a Service Generator Toolkit (SGT) that allows web services researchers to easily create large numbers of web services. When d...