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ISSTA
2006
ACM
14 years 1 months ago
Path-oriented random testing
Test campaigns usually require only a restricted subset of paths in a program to be thoroughly tested. As random testing (RT) offers interesting fault-detection capacities at low ...
Arnaud Gotlieb, Matthieu Petit
ICCAD
2006
IEEE
116views Hardware» more  ICCAD 2006»
14 years 4 months ago
Enhanced error vector magnitude (EVM) measurements for testing WLAN transceivers
As wireless LAN devices become more prevalent in the consumer electronics market, there is an ever increasing pressure to reduce their overall cost. The test cost of such devices ...
Erkan Acar, Sule Ozev, Kevin B. Redmond
ISESE
2002
IEEE
14 years 9 days ago
Elimination of Crucial Faults by a New Selective Testing Method
Recent software systems contain a lot of functions to provide various services. According to this tendency, software testing becomes more difficult than before and cost of testing...
Masayuki Hirayama, Tetsuya Yamamoto, Jiro Okayasu,...
FLAIRS
2006
13 years 8 months ago
The ASSISTment Builder: Towards an Analysis of Cost Effectiveness of ITS Creation
Intelligent Tutoring Systems, while effective at producing student learning [2,7], are notoriously costly to construct [1,9], and require PhD level experience in cognitive science...
Neil T. Heffernan, Terrence E. Turner, Abraao L. N...
ATS
1998
IEEE
170views Hardware» more  ATS 1998»
13 years 11 months ago
A Ring Architecture Strategy for BIST Test Pattern Generation
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
Christophe Fagot, Olivier Gascuel, Patrick Girard,...