46 search results - page 6 / 10 » Test Requirement Analysis for Low Cost Hierarchical Test Pat... |
SDM
2007
SIAM
13 years 8 months ago
2007
SIAM
Given a large sparse graph, how can we find patterns and anomalies? Several important applications can be modeled as large sparse graphs, e.g., network traffic monitoring, resea...
ACCV
1998
Springer
13 years 11 months ago
1998
Springer
The project we are working on is to help develop and test a low cost, large area, high resolution X-ray detection system with a high dynamic range. The large area is achieved by b...
PLDI
2010
ACM
14 years 14 days ago
2010
ACM
Many opportunities for easy, big-win, program optimizations are missed by compilers. This is especially true in highly layered Java applications. Often at the heart of these misse...
FPL
2008
Springer
13 years 9 months ago
2008
Springer
An example of an FPGA based application for a high-energy physics experiment is presented which features all facets of modern FPGA design. The special requirements here are high b...
WEA
2005
Springer
14 years 26 days ago
2005
Springer
Abstract. A5/1 pseudo-random bit generator, known from GSM networks, potentially might be used for different purposes, such as secret hiding during cryptographic hardware testing, ...