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VTS
1997
IEEE
13 years 12 months ago
1997
IEEE
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
EDBT
2010
ACM
14 years 24 days ago
2010
ACM
Database engines and database-centric applications have become complex software systems. Ensuring bug-free database services is therefore a very difficult task. Whenever possible...
EURODAC
1995
IEEE
13 years 11 months ago
1995
IEEE
: We present a new, dynamic algorithm for test sequence compaction and test cycle reduction for combinationaland sequential circuits. Several dynamic algorithms for compaction in c...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
We devise a central triangular sequence to minimize the escape routing layers in area array packaging. We use a network flow model to analyze the bottleneck of the routable pins. ...
MIAR
2006
IEEE
14 years 1 months ago
2006
IEEE
Intraoperative assistance systems aim to improve the quality of the surgery and enhance the surgeon’s capabilities. Preferable would be a system which provides support depending ...