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ISMVL
1994
IEEE

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Full Sensitivity and Test Generation for Multiple-Valued Logic Circuits

15 years 10 months ago

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Elena Dubrova, Dilian Gurov, Jon C. Muzio

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233

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AMOST
2007
ACM

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Test purpose generation in an industrial application

15 years 10 months ago

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Bernhard K. Aichernig, Martin Weiglhofer, Bernhard...

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183

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AMOST
2007
ACM

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Model-based regression test suite generation using dependence analysis

15 years 10 months ago

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Yanping Chen, Robert L. Probert, Hasan Ural

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128

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CASSIS
2004
Springer

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Mastering Test Generation from Smart Card Software Formal Models

15 years 10 months ago

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Fabrice Bouquet, Bruno Legeard, Fabien Peureux, Er...

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149

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COMPSAC
2004
IEEE

138views Software Engineering» more COMPSAC 2004»

Generating Regression Tests via Model Checking

15 years 10 months ago

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