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DAC
2005
ACM
14 years 8 months ago
StressTest: an automatic approach to test generation via activity monitors
The challenge of verifying a modern microprocessor design is an overwhelming one: Increasingly complex micro-architectures combined with heavy time-to-market pressure have forced ...
Ilya Wagner, Valeria Bertacco, Todd M. Austin
CORR
2011
Springer
151views Education» more  CORR 2011»
13 years 2 months ago
A Simulation Experiment on a Built-In Self Test Equipped with Pseudorandom Test Pattern Generator and Multi-Input Shift Register
This paper investigates the impact of the changes of the characteristic polynomials and initial loadings, on behaviour of aliasing errors of parallel signature analyzer (Multi-Inp...
A. Ahmad
TSE
2002
85views more  TSE 2002»
13 years 7 months ago
A Test Generation Strategy for Pairwise Testing
Kuo-Chung Tai, Yu Lei
ICST
2010
IEEE
13 years 5 months ago
Automated Test Data Generation on the Analyses of Feature Models: A Metamorphic Testing Approach
A Feature Model (FM) is a compact representation of all the products of a software product line. The automated extraction of information from FMs is a thriving research topic invo...
Sergio Segura, Robert M. Hierons, David Benavides,...
FORTE
2004
13 years 9 months ago
Generation of Integration Tests for Self-Testing Components
Internet software tightly integrates classic computation with communication software. Heterogeneity and complexity can be tackled with a component-based approach, where components ...
Leonardo Mariani, Mauro Pezzè, David Willmo...