5855 search results - page 7 / 1171 » Test generation and minimization with |
CORR
2010
Springer
13 years 5 months ago
2010
Springer
In the paper, an evolutionary approach to test generation for functional BIST is considered. The aim of the proposed scheme is to minimize the test data volume by allowing the dev...
ISVLSI
2007
IEEE
14 years 1 months ago
2007
IEEE
Abstract— Time-to-Market plays a central role on System-ona-Chip (SoC) competitiveness and the quality of the final product is a matter of concern as well. As SoCs complexity in...
CAV
2010
Springer
13 years 11 months ago
2010
Springer
Well-defined memory consistency models are necessary for writing correct parallel software. Developing and understanding formal specifications of hardware memory models is a chal...
IASTEDSE
2004
13 years 9 months ago
2004
Quality management is becoming a more and more important part of the software development process. As software testing is currently understood as the core function of the quality ...
ICSE
2003
IEEE-ACM
14 years 26 days ago
2003
IEEE-ACM
This paper presents a model checking-based approach to data flow testing. We characterize data flow oriented coverage criteria in temporal logic such that the problem of test ge...