5855 search results - page 89 / 1171 » Test generation and minimization with |
148
click to vote
ASPDAC
2005
ACM
15 years 11 months ago
2005
ACM
- This paper extends the depth first search (DFS) used in the previously proposed witness string method for generating efficient test vectors. A state pruning method is added that ...
191
click to vote
KBSE
2005
IEEE
15 years 11 months ago
2005
IEEE
In test generation based on model-checking, white-box test criteria are represented as trap conditions written in a temporal logic. A model checker is used to refute trap conditio...
136
click to vote
ICCD
2006
IEEE
16 years 2 months ago
2006
IEEE
—X-filling is preferred for low-capture-power scan test generation, since it reduces IR-drop-induced yield loss without the need of any circuit modification. However, the effecti...
153
click to vote
DAC
1994
ACM
15 years 10 months ago
1994
ACM
Recent results indicate that functional test pattern generation (TPG) techniques may provide better defect coverages than do traditional logic-level techniques. Functional TPG alg...