143 search results - page 8 / 29 » Test generation for designs with multiple clocks |
MHCI
2007
Springer
14 years 1 months ago
2007
Springer
In this demonstration, we present a system that enables users to easily generate quizzes for mobile devices. With our program, they can create multiple choice tests and general qu...
ISPD
2004
ACM
14 years 1 months ago
2004
ACM
As the CMOS technology is scaled into the dimension of nanometer, the clock frequencies and die sizes of ICs are shown to be increasing steadily [5]. Today, global wires that requ...
TSE
2010
13 years 2 months ago
2010
Genetic algorithms (GAs) have been applied previously to UML-driven, stress test requirements generation with the aim of increasing chances of discovering faults relating to networ...
ET
2002
13 years 7 months ago
2002
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...
ASAP
2008
IEEE
13 years 9 months ago
2008
IEEE
In this paper, we propose a novel multi-code turbo decoder architecture for 4G wireless systems. To support various 4G standards, a configurable multi-mode MAP (maximum a posterio...