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ICCD
2004
IEEE
134views Hardware» more  ICCD 2004»
14 years 4 months ago
An Automatic Test Pattern Generation Framework for Combinational Threshold Logic Networks
— We propose an automatic test pattern generation (ATPG) framework for combinational threshold networks. The motivation behind this work lies in the fact that many emerging nanot...
Pallav Gupta, Rui Zhang, Niraj K. Jha
ISSRE
2007
IEEE
13 years 9 months ago
Generating Trace-Sets for Model-based Testing
Model-checkers are powerful tools that can find individual traces through models to satisfy desired properties. These traces provide solutions to a number of problems. Instead of...
Birgitta Lindström, Paul Pettersson, Jeff Off...
EUROCRYPT
2004
Springer
14 years 25 days ago
Positive Results and Techniques for Obfuscation
Informally, an obfuscator O is an efficient, probabilistic “compiler” that transforms a program P into a new program O(P) with the same functionality as P, but such that O(P)...
Ben Lynn, Manoj Prabhakaran, Amit Sahai