244 search results - page 30 / 49 » Testing Digital Circuits with Constraints |
IFIP
2001
Springer
14 years 2 months ago
2001
Springer
: High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single In...
CADUI
2004
13 years 11 months ago
2004
: This paper presents a framework for the automatic production of Digital Talking Books (DTB). The production process converts existing audio tapes and OCR-based digitalization of ...
MHCI
2009
Springer
14 years 4 months ago
2009
Springer
Mobile users listen to large digital music libraries with thousands of songs. Browsing such libraries in mobile contexts is difficult due to constraints of the context and devices...
MEMOCODE
2007
IEEE
14 years 4 months ago
2007
IEEE
Due to the rapidly growing speed and the decreasing size of gates in modern chips, the probability of faults caused by the production process grows. Already small variations lead ...
IJCNN
2006
IEEE
14 years 3 months ago
2006
IEEE
—— Hybrid semiconductor/nanodevice (“CMOL”) technology may allow the implementation of digital and mixed-signal integrated circuits, including artificial neural networks (...