146 search results - page 6 / 30 » Testing Finitary Probabilistic Processes |
KDD
2000
ACM
13 years 11 months ago
2000
ACM
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
BIBE
2007
IEEE
14 years 1 months ago
2007
IEEE
—This paper presents a study of possible extensions of Pathway Logic to represent and reason about semiquantitative and probabilistic aspects of biological processes. The underly...
SAC
2006
ACM
14 years 1 months ago
2006
ACM
We present an emotion recognition system based on a probabilistic approach to adaptive processing of Facial Emotion Tree Structures (FETS). FETS are made up of localized Gabor fea...
AVSS
2007
IEEE
14 years 1 months ago
2007
IEEE
This paper addresses the problem of classifying human actions in a video sequence. A representation eigenspace approach based on the PCA algorithm is used to train the classifier...
VLSID
2007
IEEE
14 years 7 months ago
2007
IEEE
As technology scales to 40nm and beyond, intra-die process variability will cause large delay and leakage variations across a chip in addition to expected die-to-die variations. I...