7766 search results - page 146 / 1554 » Testing Nondeterminate Systems |
WSDM
2010
ACM
14 years 6 months ago
2010
ACM
While test collection construction is a time-consuming and expensive process, the true cost is amortized by reusing the collection over hundreds or thousands of experiments. Some ...
IJOE
2007
13 years 9 months ago
2007
: An environment targeted to e-learning is presented for teaching design and test of electronic systems. The environment consists of a set of Java applets, and of web based access ...
TAP
2008
Springer
13 years 9 months ago
2008
Springer
Abstract. In recent years, we see a growing awareness to the importance of assessing the quality of specifications. In the context of model checking, this can be done by analyzing ...
ETS
2007
IEEE
14 years 3 months ago
2007
IEEE
This paper summarizes advanced test patterns designed to target dynamic and time-related faults caused by new defect mechanisms in deep-submicron memory technologies. Such tests a...
ISCAS
2006
IEEE
14 years 3 months ago
2006
IEEE
—We present an efficient approach for on-chip frequency response measurement, including phase and gain, of analog circuitry in mixed-signal systems. The approach uses direct digi...