—Large scale systems (LSS) contain multiple subsystems that interact across multiple nodes in sometimes unforeseen and complicated ways. As a result, pinpointing the subsystems t...
The discrepancy between integrated circuits' activities in normal functional mode and that in structural test mode has an increasing adverse impact on the effectiveness of ma...
Pre-fabrication design verification and post-fabrication chip testing are two important stages in the product realization process. These two stages consume a large part of resourc...
Despite years of availability of testing tools, professional software developers still seem to need better support to determine the effectiveness of their tests. Without improveme...
Joseph Lawrance, Steven Clarke, Margaret M. Burnet...
According to the progress of high-speed networks, many communication protocols are specified as concurrent systems. Such systems can be modeled as concurrent deterministic FSMs (D...