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KDD
2000
ACM
211views Data Mining» more  KDD 2000»
14 years 17 days ago
Mining IC test data to optimize VLSI testing
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Tony Fountain, Thomas G. Dietterich, Bill Sudyka
IJAIT
2000
142views more  IJAIT 2000»
13 years 8 months ago
Adequacy of Limited Testing for Knowledge Based Systems
Knowledge-based engineering and computational intelligence are expected to become core technologies in the design and manufacturing for the next generation of space exploration mi...
Tim Menzies, Bojan Cukic
IWPSE
2007
IEEE
14 years 3 months ago
Talking tests: an empirical assessment of the role of fit acceptance tests in clarifying requirements
The starting point for software evolution is usually a change request, expressing the new or updated requirements on the delivered system. The requirements specified in a change ...
Filippo Ricca, Marco Torchiano, Mariano Ceccato, P...
KIVS
1997
Springer
14 years 1 months ago
Conformance Testing of Objects in Distributed Processing Systems
The object model is a very popular paradigm for building distributed applications. Several standardisation efforts are underway that define architectures for distributed computing...
Brigitte Bär, Kurt Geihs
FORTE
1997
13 years 10 months ago
Refusal Testing for Classes of Transition Systems with Inputs and Outputs
This paper presents a testing theory that is parameterised with assumptions about the way implementations communicate with their environment. In this way some existing testing the...
Lex Heerink, Jan Tretmans