1610 search results - page 247 / 322 » Testing Patterns |
INFOCOM
2003
IEEE
14 years 3 months ago
2003
IEEE
Abstract— We investigate a widely popular Least-RecentlyUsed (LRU) cache replacement algorithm with semi-Markov modulated requests. Semi-Markov processes provide the flexibility...
ISQED
2003
IEEE
14 years 3 months ago
2003
IEEE
To save layout area for electrostatic discharge (ESD) protection design in the SOC era, test chip with large size NMOS devices placed under bond pads has been fabricated in 0.35-Â...
GECCO
2003
Springer
14 years 3 months ago
2003
Springer
When using a Genetic Algorithm (GA) to optimize the feature space of pattern classification problems, the performance improvement is not only determined by the data set used, but a...
IBPRIA
2003
Springer
14 years 3 months ago
2003
Springer
Nowadays, the surveillance and inspection of underwater installations, such as power and telecommunication cables and pipelines, is carried out by trained operators who, from the s...
IBPRIA
2003
Springer
14 years 3 months ago
2003
Springer
We describe a technique for extracting vertices from range images of cluttered box-like objects. Edge detection is performed and an edge map is acquired. Extraction of vertices is ...