1610 search results - page 265 / 322 » Testing Patterns |
MICAI
2010
Springer
2010
Springer
Combining Neural Networks Based on Dempster-Shafer Theory for Classifying Data with Imperfect Labels
13 years 7 months ago
This paper addresses the supervised learning in which the class membership of training data are subject to uncertainty. This problem is tackled in the framework of the Dempster-Sha...
NOMS
2010
IEEE
13 years 7 months ago
2010
IEEE
—The online detection of anomalies is a vital element of operations in data centers and in utility clouds like Amazon EC2. Given ever-increasing data center sizes coupled with th...
PAMI
2010
13 years 7 months ago
2010
—This paper addresses pattern classification in the framework of domain adaptation by considering methods that solve problems in which training data are assumed to be available o...
PC
2010
13 years 7 months ago
2010
The fat-tree is one of the topologies most widely used to build high-performance parallel computers. However, they are expensive and difficult to build. In this paper we propose t...
SIGECOM
2010
ACM
13 years 7 months ago
2010
ACM
We conduct laboratory experiments on variants of market scoring rule prediction markets, under different information distribution patterns, in order to evaluate the efficiency an...