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COMPSAC
2008
IEEE
13 years 10 months ago
Superfit Combinational Elusive Bug Detection
Software that has been well tested and analyzed may fail unpredictably when a certain combination of conditions occurs. In Bounded Exhaustive Testing (BET) all combinations are te...
R. Barzin, S. Fukushima, William E. Howden, S. Sha...
TSD
2005
Springer
14 years 3 months ago
A Theme Allocation for a Sentence Based on Head Driven Patterns
Since sentences are the basic propositional units of text, knowing their themes should help various tasks requiring the knowledge about the semantic content of text. In this paper,...
Bo-Yeong Kang, Sung-Hyon Myaeng
GLVLSI
2006
IEEE
101views VLSI» more  GLVLSI 2006»
14 years 4 months ago
Measurement and characterization of pattern dependent process variations of interconnect resistance, capacitance and inductance
Process variations have become a serious concern for nanometer technologies. The interconnect and device variations include interand intra-die variations of geometries, as well as...
Xiaoning Qi, Alex Gyure, Yansheng Luo, Sam C. Lo, ...
DSN
2007
IEEE
14 years 4 months ago
Web Services Wind Tunnel: On Performance Testing Large-Scale Stateful Web Services
New versions of existing large-scale web services such as Passport.com© have to go through rigorous performance evaluations in order to ensure a high degree of availability. Perf...
Marcelo De Barros, Jing Shiau, Chen Shang, Kenton ...
MTDT
2003
IEEE
164views Hardware» more  MTDT 2003»
14 years 3 months ago
Applying Defect-Based Test to Embedded Memories in a COT Model
ct Defect-based testing for digital logic concentrates primarily on methods of test application, including for example at-speed structural tests and IDDQ testing. In contrast, defe...
Robert C. Aitken