6704 search results - page 112 / 1341 » Testing Scenario-Based Models |
118
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VTS
1996
IEEE
15 years 6 months ago
1996
IEEE
In this paper we investigate optimal voltage testing approaches for physically-based faults in CMOS circuits. We describe the general nature of the problem and then focus on two f...
147
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FORTE
2008
15 years 3 months ago
2008
Network-based fuzz testing has become an effective mechanism to ensure the security and reliability of communication protocol systems. However, fuzz testing is still conducted in a...
162
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ICST
2010
IEEE
15 years 28 days ago
2010
IEEE
Abstract—Software Product Lines (SPL) are difficult to validate due to combinatorics induced by variability across their features. This leads to combinatorial explosion of the n...
130
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CAV
2005
Springer
15 years 8 months ago
2005
Springer
Statistical methods to model check stochastic systems have been, thus far, developed only for a sublogic of continuous stochastic logic (CSL) that does not have steady state operat...
132
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SBMF
2009
Springer
15 years 9 months ago
2009
Springer
In today’s information society, flash memory has become a virtually indispensable component, particularly for mobile devices. In order for mobile devices to operate successfully...